The experiment ASPIDE is focused on the development of advanced techniques for characterization and diagnostics of semiconductor detectors and readout electronics in a wide range of ionization levels by means of mono-energetic protons with high spatial and temporal resolution.
The program includes the validation of the developed experimental techniques on relevant case studies, e.g. mapping the response matrix of detection systems for different charge levels by digitization of the output waveforms and their analysis with dedicated deconvolution algorithms.
The activities in ASPIDE will link synergically with the scientific activities in the frame of the international DSSC Consortium (DSSC, DEPFET Sensor with Signal Compression) for the development of new 2D imaging detectors for the European X-Ray Free Electron Laser (XFEL) at Desy which demand characterization techniques compatible with the foreseen levels of charge injection.